| Titolo | Structural investigation of YBCO films and bicrystal grain boundary junctions |
|---|---|
| Tipo di pubblicazione | Articolo su Rivista peer-reviewed |
| Anno di Pubblicazione | 1994 |
| Autori | Del Vecchio, A., Camerlingo C., De Riccardis Maria Federica, Huang H., Ruggiero B., Russo M., Sarnelli E., Tagliente M.A., Tapfer Leander, and Testa G. |
| Rivista | Il Nuovo Cimento D |
| Volume | 16 |
| Paginazione | 2025-2030 |
| ISSN | 03926737 |
| Abstract | We present a structural analysis of YBCO superconducting thin films fabricated in situ by Inverted Cylindrical Magnetron (ICM) sputtering on commercial SrTiO3 single-crystal and bicrystal substrates. A detailed structural characterization of the superconductor films was performed by using single-crystal X-ray diffractometry confirming that YBCO films have a strong c-axis orientation of the grains with a small mosaic spread. In the films grown on bicrystal substrates we observed a strong correlation with the lattice structure of the substrate. In addition, a surface analysis of the region across the grain boundary edge has been performed by using scanning electron microscopy. © 1994 Società Italiana di Fisica. |
| Note | cited By 4 |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-51249161485&doi=10.1007%2fBF02471862&partnerID=40&md5=d86ea123db0328cdfa28d802ced5417f |
| DOI | 10.1007/BF02471862 |
| Citation Key | DelVecchio19942025 |
